XRD at room temperature with typical scans being:
θ-2θ scans ω scans (rocking curves)
φ-scans reciprocal space maps (RSM)
Instrument Scientist:
Hanjong Paik, Ph.D
Thin-film Growth Facilities at Cornell University
Equipment
Four-circle X-ray diffractometer (XRD)
National Science Foundation (Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM)) under Cooperative Agreement No. DMR-1539918.
