Electron Microscopy

Tescan Amber X 2 Xenon Plasma FIB

Brenda Fisher — Tue, 19 Aug 2025 18:35:42 +0000

Tescan Amber X 2 Xenon Plasma FIB Brenda Fisher Tue, 08/19/2025 - 14:35

High throughput gallium-free TEM sample prep with 0.5-30 keV Xe+ ion column
Ultra-high resolution SEM column with in-lens energy-filtering detectors
Cryogenic sample stage for sensitive and frozen sample preparation at liquid nitrogen temperature
Rapid large area milling for FIB tomography

Instrument Scientist:

Steven Zeltmann

Tool Area

Electron Microscopy

TFS Spectra 300 Andromeda S/TEM + X-CFEG

Brenda Fisher — Thu, 27 Jul 2023 01:17:55 +0000

TFS Spectra 300 Andromeda S/TEM + X-CFEG Brenda Fisher Wed, 07/26/2023 - 21:17

Andromeda is specially optimized for imaging of magnetic materials, featuring a newly designed minicondenser lens that allows for higher resolution while maintaining zero magnetic field at the sample plane.
Ultrabright cold field emission gun (CFEG) provides 10x higher brightness than previous generation microscopes
Cs probe aberration corrector
High-solid angle dual X-ray detectors for elemental mapping
EMPAD G2 for high-speed, high dynamic range 4D-STEM data acquisition
ThermoFisher SelectrisX EELS spectrometer with aberration correction and multiEELS Zebra detector allows acquisition of up to 5 energy ranges simultaneously with constant focus across the entire energy range

Instrument Scientist:

Steven Zeltmann

Tool Area

Electron Microscopy

EMPAD Detector

Jim Overhiser — Fri, 31 Jul 2020 15:25:00 +0000

EMPAD Detector Jim Overhiser Fri, 07/31/2020 - 11:25

High-speed, high-dynamic range momentum-resolved electron microscope pixel-array detector developed by Muller and collaborators
Quantitative metrology of structure and physical properties at the atomic scale
Picometer-precision measurements of lattice constants
Quantitative characterization of strain, crystal orientation, local polarity
Measurements of electric and magnetic fields
Ptychography enables 2.5-fold improvement in resolution over current state of the art methods

Sample Publications Using this Instrument

H.T. Philipp, M.W. Tate, K.S. Shanks, L. Mele, M. Peemen, P. Dona, R. Hartong, G. van Veen, Y.-T. Shao, Z. Chen, J. Thom-Levy, D.A. Muller, and S.M. Gruner, "Very-High Dynamic Range, 10,000 frames/second Pixel Array Detector for Electron Microscopy," arXiv.org/2111.05889 (2021).

Z. Chen, Y. Jiang, Y.-T. Shao, M.E. Holtz, M. Odstrčil, M. Guizar-Sicairos, I. Hanke, S. Ganschow, D.G. Schlom, and D.A. Muller, "Electron Ptychography Achieves Atomic-Resolution Limits Set by Lattice Vibrations," Science 372, 826-831 (2021) and Highlight #42.

Z. Chen, M. Odstrcil, Y. Jiang, Y. Han, M.-H. Chiu, L.-J. Li, and D.A. Muller, “Mixed-State Electron Ptychography Enables Sub-Angstrom Resolution Imaging with Picometer Precision at Low Dose,” Nat. Commun. 11, 2994 (2020) and Highlight #27.

Y. Jiang, Z. Chen, Y. Han, P. Deb, H. Gao, S. Xie, P. Purohit, M.W. Tate, J. Park, S.M. Gruner, V. Elser, and D.A. Muller, “Electron Ptychography of 2D Materials to Deep Sub-Ångström Resolution,” Nature 559, 343–349 (2018) and Highlight #6.

Tool Area

Electron Microscopy

FEI/Thermo Fisher Titan Themis CryoS/TEM 60-300kV

Jim Overhiser — Fri, 31 Jul 2020 15:24:00 +0000

FEI/Thermo Fisher Titan Themis CryoS/TEM 60-300kV Jim Overhiser Fri, 07/31/2020 - 11:24

FEI/Thermo Fisher Titan Themis CryoS/TEM 60-300kV

Physical Sciences Building Rm B-91

Field emission gun (X-FEG)

C_s probe aberration correction

Fully aligned for operation at 60kV, 80kV, 120kV and 300kV

high-speed GIF Quantum for EELS mapping

Gatan K2 direct electron detector at the back of the spectrometer for rapid core-loss EELS mapping and energy-filtered low-dose TEM

100meV energy resolution with monochromation

EMPAD for electromagnetic field, strain and polarization mapping

Cryo-box for low temperature experiments

Lorentz lens for field free imaging

High-brightness cold field emission gun

The FEI CryoS/TEM is the result of NSF MRI award (1429155) and is the first monochromated, high-resolution cryo-S/TEM of its kind. This instrument is capable of imaging inorganic and organic materials at the nanoscale. It is equipped with a Field Emission Gun (X-FEG), a monochromator, probe corrector (STEM) and the availability of single and double tilt holders for room temperature and cryo work. The microscope is set up for data collection at 60, 80, 120, and 300 kV providing resolutions of up to 0.08 nm.

This revolutionary instrument allows for imaging of materials samples, such as batteries and how they degrade over time, and the study proteins and cellular components in native-like state at cryogenic temperatures. The cryo-S/TEM bridges the fields of materials and biological sciences, providing a unique platform to conduct interdisciplinary (biology, engineering, chemistry, and physics) research at atomic resolution. Samples ranging from rechargeable batteries, crystals, to isolated proteins and cells can be imaged seamlessly.

Available modes for data acquisition include: TEM, cryoTEM, cryo tomography, Bright Field/Dark Field TEM/STEM, EELS, STEM, Lorentz TEM/STEM, and Low Dose imaging along with specialized holders necessary for preserving samples. The Cryo-S/TEM is equipped with a Gatan GIF Tridiem energy filter for EELS and high resolution single particle applications, a retractable cryo box for conducting data acquisition of materials and biological samples at liquid nitrogen temperatures, an FEI Ceta 16M camera a K2 Summit direct detector.

Sample Publications Using this Instrument

S.H. Sung, N. Schnitzer, S. Novakov, I. El Baggari, X. Luo, J. Gim, N. Vu, Z. Li, T. Brintlinger, Y. Liu, W. Lu, Y. Sun, P. Deotare, K. Sun, L. Zhao, L.F. Kourkoutis, J.T. Heron, and R. Hovden, "Two-Dimensional Charge Order Stabilized in Clean Polytype Heterostructures," Nat. Commun. 13, 413 (2022).

Tool Area

Electron Microscopy

NION UltraSTEM 100

Jim Overhiser — Fri, 31 Jul 2020 15:23:15 +0000

NION UltraSTEM 100 Jim Overhiser Fri, 07/31/2020 - 11:23

NION UltraSTEM 100

Cold field emission gun (CFEG)
C_s probe aberration correction
Sub-Angstrom-scale probe with 0.1 nA of current enables imaging with sub-angstrom (<0.1 nm) resolution
Electron optics can be changed to produce a 2-3 angstrom probe with 1 nA or more of current for analytical purposes
Optimized for high-spatial and spectral resolution EELS
High-stability stage enables atomic-resolution EELS mapping over large length scales

NION UltraSTEM 100

Location: Duffield Hall 150

The SuperSTEM has a spherical aberration corrector integrated into its column, which nulls all axial aberrations up to fifth order. As a result, an angstrom-scale probe with 0.1 nA of current enables imaging with angstrom-level (0.1 nm) resolution. The electron optics can be quickly changed to produce a 2-3 angstrom probe with 1 nA or more of current for analytical purposes (electron energy loss spectroscopy). Samples can be automatically oriented to a given axis.

Instrument Scientist:

Don Werder

Tool Area

Electron Microscopy

FEI TF20 monochromated S/TEM

Jim Overhiser — Fri, 31 Jul 2020 15:22:00 +0000

FEI TF20 monochromated S/TEM Jim Overhiser Fri, 07/31/2020 - 11:22

Field emission gun (FEG)
Fully aligned for operation at 120kV and 200kV
1 Å in TEM and 1.4 Å in STEM
GIF Tridium for EELS, energy filtered TEM elemental maps, low-loss studies (e.g. band gap analysis), chemical bonding information at nanometer resolution.
Sub-200meV energy resolution with monochromation
Electron tomography for determining 3-D structure from 2-D projections

FEI F20 TEM STEM

Sulfur Encapsulation by MOF-derived CoS2 embedded in carbon hosts for high-performance Li-S batteries, Na Zhang et. al; JAMA DOI: 10.1039/c9ta06947j

Duffield Hall 150

200 kV field emission transmission electron microscope with monochromator. 1 Å in TEM and 1.4 Å in STEM. Equipped with a Gatan tridium spectrometer for electron energy loss spectroscopy spectra at high energy resolution <0.2 eV, optimized recording of energy filtered TEM elemental maps, EELS low-loss studies (e.g. band gap analysis), and chemical bonding information at nanometer resolution. The Tecnai is also able to do electron tomography, which produces 3-D structures from 2-D projections, by acquiring an image every 2 degrees at angles +/- 70 degrees. This is only possible using our tomography holder and specialized software.

For rates information, please see the rates page.

Reservation Rules:
2-week reservation window in FOM. Reservations should be minimum of 4 hours with start times at 8 AM or 1 PM to maximize instrument usage.

One reservation per week permitted during any 1-week window.

Additional times can be reserved if within 48 hours of the start time. Contact manager for any reservation exceptions.

120 kV usage on Thursdays and Fridays only to allow for voltage changes.

Instrument Scientist:

Don Werder

Tool Area

Electron Microscopy

FEI T12 BioTwin TEM

Jim Overhiser — Fri, 31 Jul 2020 15:21:00 +0000

FEI T12 BioTwin TEM Jim Overhiser Fri, 07/31/2020 - 11:21

Typically operated at 120 kV (can easily be aligned at 60, 80, and 100kV if needed)
Electron source: Lanthanum hexaboride (LaB6) crystal or a Tungsten (W) filament
Cryo-box enables imaging at both room and cryogenic temperatures
Fully motorized eucentric goniometer stage, tilt range ±80°
High-resolution, high-contrast, thermoelectrically cooled Gatan Orius® 1000 dual-scan CCD camera

Tool Area

Electron Microscopy

TFS Helios G4 UX DualBeam FIB

Jim Overhiser — Fri, 31 Jul 2020 15:20:00 +0000

TFS Helios G4 UX DualBeam FIB Jim Overhiser Fri, 07/31/2020 - 11:20

Elstar electron column with the next-generation UC+ technology enables high resolution secondary and backscattered imaging even at low voltages
Advanced Phoenix Ion Column with Fast Beam Blanker
High resolution milling not only at high voltages, but even down to low voltages critical for production of high-quality lamella with minimal damage layers for TEM
Beam currents extend three times higher than previously available
Sample stage is a 150 x 150 mm eucentric piezo stage with an in-chamber Nav-Cam for accurate positioning of samples
EasyLift EX NanoManipulator enables fully or semi-automated TEM sample preparation, significantly reducing the time required to produce specimens.

Sample Publications Using this Instrument

L. Caretta, Y.-T. Shao, J. Yu, A.B. Mei, B.F. Grosso, C. Dai, P. Behera, D. Lee, M. McCarter, E. Parsonnet, Harikrishnan K.P., F. Xue, X. Guo, E.S. Barnard, S. Ganschow, Z. Hong, A. Raja, L.W. Martin, L.-Q. Chen, M. Fiebig, K. Lai, N.A. Spaldin, D.A. Muller, D.G. Schlom, and R. Ramesh, "Non-Volatile Electric-Field Control of Inversion Symmetry," Nat. Mater. 22, 207–215 (2023) and Highlight #67

Tool Area

Electron Microscopy

TFS Spectra 300 Kraken S/TEM + X-CFEG

Jim Overhiser — Fri, 31 Jul 2020 13:14:24 +0000

TFS Spectra 300 Kraken S/TEM + X-CFEG Jim Overhiser Fri, 07/31/2020 - 09:14

Ultrabright cold field emission gun (CFEG) provides 10-fold improvement in brightness over the Titan STEM
C_s probe aberration corrector (S-CORR)
High-solid angle (1.7 Sr) x-ray detectors for sub-angstrom elemental mapping
Rapid EELS mapping at 0.3eV energy resolution with GIF Continuum + Dual EELS
EMPAD for electromagnetic field, strain and polarization mapping

Sample Publications Using this Instrument

G.A. Pan, D.F. Segedin, H. LaBollita, Q. Song, E.M. Nica, B.H. Goodge, A.T. Pierce, S. Doyle, S. Novakov, D. Córdova Carrizales, A.T. N’Diaye, P. Shafer, H. Paik, J.T. Heron, J.A. Mason, A. Yacoby, L.F. Kourkoutis, O. Erten, C.M. Brooks, A.S. Botana, and J.A. Mundy, "Superconductivity in a Quintuple-Layer Square-Planar Nickelate," Nat. Mater. 21, 160–164 (2022) and Highlight #50.

Instrument Scientist:

Steven Zeltmann

Tool Area

Electron Microscopy

Specialized in situ cooling/heating/biasing holders

Jim Overhiser — Wed, 01 Jul 2020 13:27:24 +0000

Specialized in situ cooling/heating/biasing holders Jim Overhiser Wed, 07/01/2020 - 09:27

HennyZ variable temperature dual tilt LN₂ cryo-holder for sub-angstrom imaging near liquid nitrogen temperature and above (100-1000K)
DENSsolutions in situ heating/biasing dual-tilt holder allows in-situ heating and biasing experiments at temperatures up to 1000°C while still preserving atomic resolution
High-tilt, dual axis and 360° tomography holders for 3D-reconstructions

Instrument Scientist:

Don Werder

Tool Area

Electron Microscopy