Corona Virus Information Updated February 5, 2021

NION UltraSTEM 100

NION UltraSTEM 100

NION UltraSTEM 100

  • Cold field emission gun (CFEG)
  • Cs probe aberration correction
  • Sub-Angstrom-scale probe with 0.1 nA of current enables imaging with sub-angstrom (<0.1 nm) resolution
  • Electron optics can be changed to produce a 2-3 angstrom probe with 1 nA or more of current for analytical purposes
  • Optimized for high-spatial and spectral resolution EELS
  • High-stability stage enables atomic-resolution EELS mapping over large length scales

 

 

NION UltraSTEM 100

STEM super

Location:  Duffield Hall 150

The SuperSTEM has a spherical aberration corrector integrated into its column, which nulls all axial aberrations up to fifth order. As a result, an angstrom-scale probe with 0.1 nA of current enables imaging with angstrom-level (0.1 nm) resolution. The electron optics can be quickly changed to produce a 2-3 angstrom probe with 1 nA or more of current for analytical purposes (electron energy loss spectroscopy). Samples can be automatically oriented to a given axis.

NION

Instrument Scientist: