Corona Virus Information Updated July 15, 2020

Equipment

NION UltraSTEM 100

NION UltraSTEM 100
  • Cold field emission gun (CFEG)
  • Cs probe aberration correction
  • Sub-Angstrom-scale probe with 0.1 nA of current enables imaging with sub-angstrom (<0.1 nm) resolution
  • Electron optics can be changed to produce a 2-3 angstrom probe with 1 nA or more of current for analytical purposes
  • Optimized for high-spatial and spectral resolution EELS
  • High-stability stage enables atomic-resolution EELS mapping over large length scales
Instrument Scientist: