- Cold field emission gun (CFEG)
- Cs probe aberration correction
- Sub-Angstrom-scale probe with 0.1 nA of current enables imaging with sub-angstrom (<0.1 nm) resolution
- Electron optics can be changed to produce a 2-3 angstrom probe with 1 nA or more of current for analytical purposes
- Optimized for high-spatial and spectral resolution EELS
- High-stability stage enables atomic-resolution EELS mapping over large length scales
Instrument Scientist:
Tool Area
