• Andromeda is specially optimized for imaging of magnetic materials, featuring a newly designed minicondenser lens that allows for higher resolution while maintaining zero magnetic field at the sample plane.
• Ultrabright cold field emission gun (CFEG) provides 10x higher brightness than previous generation microscopes
• Cs probe aberration corrector
• High-solid angle dual X-ray detectors for elemental mapping
• EMPAD G2 for high-speed, high dynamic range 4D-STEM data acquisition 

• High-speed, high-dynamic range momentum-resolved electron microscope pixel-array detector developed by Muller and collaborators
• Quantitative metrology of structure and physical properties at the atomic scale
• Picometer-precision measurements of lattice constants
• Quantitative characterization of strain, crystal orientation, local polarity
• Measurements of electric and magnetic fields
• Ptychography e

Sample Publications Using this Instrument

H.T. Philipp, M.W. Tate, K.S. Shanks, L. Mele, M. Peemen, P. Dona, R. Hartong, G. van Veen, Y.-T. Shao, Z. Chen, J. Thom-Levy, D.A. Muller, and S.M. Gruner, "Very-High Dynamic Range, 10,000 frames/second Pixel Array Detector for Electron Microscopy," arXiv.org/2111.05889 (2021).

FEI/Thermo Fisher Titan Themis CryoS/TEM 60-300kV

Physical Sciences Building Rm B-91

Field emission gun (X-FEG)

C_s probe aberration correction

Fully aligned for operation at 60kV, 80kV, 120kV and 300kV

Sample Publications Using this Instrument

S.H. Sung, N. Schnitzer, S. Novakov, I. El Baggari, X. Luo, J. Gim, N. Vu, Z. Li, T. Brintlinger, Y. Liu, W. Lu, Y. Sun, P. Deotare, K. Sun, L. Zhao, L.F. Kourkoutis, J.T. Heron, and R. Hovden, "Two-Dimensional Charge Order Stabilized in Clean Polytype Heterostructures," Nat. Commun. 13, 413 (2022).

NION UltraSTEM 100

• Cold field emission gun (CFEG)
• C_s probe aberration correction
• Sub-Angstrom-scale probe with 0.1 nA of current enables imaging with sub-angstrom (<0.1 nm) resolution
• Electron optics can be changed to produce a 2-3 angstrom probe with 1 nA or more of current for analytical purposes
• Optimized for high-spatial and spectral resolution EELS
• High-stability st

• Field emission gun (FEG)
• Fully aligned for operation at 120kV and 200kV
• 1 Å in TEM and 1.4 Å in STEM
• GIF Tridium for EELS, energy filtered TEM elemental maps, low-loss studies (e.g. band gap analysis), chemical bonding information at nanometer resolution.

• Typically operated at 120 kV (can easily be aligned at 60, 80, and 100kV if needed)
• Electron source: Lanthanum hexaboride (LaB6) crystal or a Tungsten (W) filament
• Cryo-box enables imaging at both room and cryogenic temperatures
• Fully motorized eucentric goniometer stage, tilt range ±80°
• High-resolution, high-contrast, thermoelectrically cooled Gatan Orius® 1000 dual-scan CCD camera

• Elstar electron column with the next-generation UC+ technology enables high resolution secondary and backscattered imaging even at low voltages
• Advanced Phoenix Ion Column with Fast Beam Blanker
• High resolution milling not only at high voltages, but even down to low voltages critical for production of high-quality lamella with minimal damage layers for TEM
• Beam currents extend three times higher than previously available
• Sample

Sample Publications Using this Instrument

L. Caretta, Y.-T. Shao, J. Yu, A.B. Mei, B.F. Grosso, C. Dai, P. Behera, D. Lee, M. McCarter, E. Parsonnet, Harikrishnan K.P., F. Xue, X. Guo, E.S. Barnard, S. Ganschow, Z. Hong, A. Raja, L.W. Martin, L.-Q. Chen, M. Fiebig, K. Lai, N.A. Spaldin, D.A. Muller, D.G. Schlom, and R. Ramesh, "Non-Volatile Electric-Field Control of Inversion Symmetry," Nat.

Sample Publications Using this Instrument

L. Caretta, Y.-T. Shao, J. Yu, A.B. Mei, B.F. Grosso, C. Dai, P. Behera, D. Lee, M. McCarter, E. Parsonnet, Harikrishnan K.P., F. Xue, X. Guo, E.S. Barnard, S. Ganschow, Z. Hong, A. Raja, L.W. Martin, L.-Q. Chen, M. Fiebig, K. Lai, N.A. Spaldin, D.A. Muller, D.G. Schlom, and R. Ramesh, "Non-Volatile Electric-Field Control of Inversion Symmetry," Nat.