TFS Helios G4 UX DualBeam FIB
- Elstar electron column with the next-generation UC+ technology enables high resolution secondary and backscattered imaging even at low voltages
- Advanced Phoenix Ion Column with Fast Beam Blanker
- High resolution milling not only at high voltages, but even down to low voltages critical for production of high-quality lamella with minimal damage layers for TEM
- Beam currents extend three times higher than previously available
- Sample stage is a 150 x 150 mm eucentric piezo stage with an in-chamber Nav-Cam for accurate positioning of samples
- EasyLift EX NanoManipulator enables fully or semi-automated TEM sample preparation, significantly reducing the time required to produce specimens.