- High-speed, high-dynamic range momentum-resolved electron microscope pixel-array detector developed by Muller and collaborators
- Quantitative metrology of structure and physical properties at the atomic scale
- Picometer-precision measurements of lattice constants
- Quantitative characterization of strain, crystal orientation, local polarity
- Measurements of electric and magnetic fields
- Ptychography enables 2.5-fold improvement in resolution over current state of the art methods
Instrument Scientist:
Tool Area
